SN74AS760DWR lignende

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- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
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- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74AS760DWR Datasheet og Spec

Fabrikant : TI

Packing : DW

Pins : 20

Temperature : Min 0 °C | Max 70 °C

Størrelse : 104 KB

Anvendelse : OCTAL BUFFERS/LINE DRIVERS WITH OPEN-COLLECTOR OUTPUTS